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Volumn 412, Issue , 2004, Pages
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The effect of rubbing strength on the formation of zigzag defects in surface stabilised ferroelectric liquid crystals
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Author keywords
Atomic force microscopy; Ferroelectric liquid crystal; FLC alignment; Reflection anisotropy spectroscopy; Rubbed polyimide; Zigzag lines
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Indexed keywords
ANISOTROPY;
ATOMIC FORCE MICROSCOPY;
CRYSTAL DEFECTS;
ELLIPSOMETRY;
FERROELECTRIC MATERIALS;
MOLECULAR ORIENTATION;
POLYIMIDES;
SPECTROSCOPIC ANALYSIS;
SURFACE TOPOGRAPHY;
FERROELECTRIC LIQUID CRYSTAL (FLC);
FLC ALIGNMENT;
REFLECTION ANISOTROPY SPECTROSCOPY;
RUBBED POLYIMIDE;
ZIGZAG LINES;
LIQUID CRYSTALS;
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EID: 12844275045
PISSN: 15421406
EISSN: None
Source Type: Journal
DOI: 10.1080/15421400490439860 Document Type: Conference Paper |
Times cited : (5)
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References (17)
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