Method of characterizing rubbed polyimide film for liquid crystal display devices using reflection ellipsometry

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 11, 1996, Pages 5873-5875

  Hirosawa, Ichiro ^a  

^a NEC CORPORATION   (Japan)

Author keywords

Ellipsometry; Liquid crystal; Molecular orientation; Polyimide; Rubbing

Indexed keywords

ANISOTROPIC POLARIZATION; POLYIMIDE FILMS; REFLECTION ELLIPSOMETRY;

ELLIPSOMETRY; LIGHT POLARIZATION; LIGHT REFLECTION; LIQUID CRYSTAL DISPLAYS; LIQUID CRYSTALS; MOLECULAR ORIENTATION; PERMITTIVITY; POLYIMIDES; SEMICONDUCTING POLYMERS;

SEMICONDUCTING FILMS;

EID: 0030289852     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.5873     Document Type: Article

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