Effects of surface topography on formation of defects in [Formula Presented] devices explained using an alternative chevron description

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 56, Issue 4, 1997, Pages R3769-R3771

  Watson, P ^a   Bos, P J ^a   Pirs, J ^b  

^a KENT STATE UNIVERSITY   (United States)

^b UNIVERSITY OF LJUBLJANA   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001555450     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.56.R3769     Document Type: Article

References (6)

1. N A. Clark and S T. Lagerwall, Appl. Phys. Lett.36, 899 (1980).
2. M. Koden, T. Numao, N. Itoh, M. Shiomi, S. Miyoshi, and T. Wada, Proceedings of the 12th International Display Research Conference, Hiroshima, Japan, (Society for Information Display, Playa del Rey, CA, 1992), pp. 519–522.
3. J. Kanbe, H. Inoue, A. Mizutome, Y. Hanyuu, K. Katagiri, and S. Yoshihara, Ferroelectrics114, 3 (1991).
4. Tsuboyama, Y. Hanyu, S. Yoshihara, and J. Kanbe, Proceedings of the 12th International Display Research Conference, Ref. 2, pp. 53, 54.
5. H. Okada, N. Ninomiya, H. Onnagawa, and K. Miyashita, Society for Information Display International Symposium Digest of Technical Papers (Society for Information Display, Playa del Rey, CA, 1992), Vol. XXXIII, pp. 239, 240.
6. H. Okada (private communication).