Relation between molecular orientation and rubbing strength observed by reflection ellipsometry

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 8, 1997, Pages 5192-5196

  Hirosawa, Ichiro ^a  

^a NEC CORPORATION   (Japan)

Author keywords

Liquid crystal; Polyimide film; Reflection ellipsometry; Rubbing

Indexed keywords

POLYIMIDE FILMS; REFLECTION ELLIPSOMETRY; RUBBING STRENGTH;

DIELECTRIC PROPERTIES OF SOLIDS; ELLIPSOMETRY; LIQUID CRYSTALS; MOLECULAR ORIENTATION; POLYIMIDES;

PLASTIC FILMS;

EID: 0031212810     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.5192     Document Type: Article

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