Impact of current crowding on electromigration-induced mass transport

Applied Physics Letters

Volumn 84, Issue 4, 2004, Pages 517-519

  Wang, H ^a   Bruynseraede, C ^a   Maex, K ^a,b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRYSTAL GROWTH; CURRENT DENSITY; DIELECTRIC MATERIALS; DIFFUSION; ELECTRIC WIRE; FINITE ELEMENT METHOD; GRAIN BOUNDARIES; HEAT FLUX; HEAT LOSSES; HEAT TRANSFER; MASS TRANSFER; NUCLEATION; TEMPERATURE DISTRIBUTION;

ATOMIC FLUX; CURRENT CROWNING; FLUX DIVERGENCE;

ELECTROMIGRATION;

EID: 1242329852     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1644048     Document Type: Article

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