Growth and characterization of La0.8Sr0.2MnO 3/Pb(Zr0.2Ti0.8)O3/La 0.8Sr0.2MnO3 heterostructures for three-dimensional circuit studies

Annalen der Physik (Leipzig)

Volumn 13, Issue 1-2, 2004, Pages 15-19

  Hong, X ^a   Xiao, F ^a   Reiner, J W ^a   Posadas, A ^a   Ahn, C H ^a  

^a Yale University   (United States)

Author keywords

Colossal magnetoresistance; Heterostructure; Three dimensional circuit

Indexed keywords

CARRIER CONCENTRATION; CMOS INTEGRATED CIRCUITS; COLOSSAL MAGNETORESISTANCE; ELECTROMAGNETIC WAVE POLARIZATION; EPITAXIAL GROWTH; FERROELECTRICITY; HETEROJUNCTIONS; HIGH TEMPERATURE SUPERCONDUCTORS; PIEZOELECTRIC MATERIALS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

METALLIC DENSITIES; THREE DIMENSIONAL CIRCUIT;

LANTHANUM COMPOUNDS;

EID: 1242329389     PISSN: 00033804     EISSN: None     Source Type: Journal    
DOI: 10.1002/andp.200310035     Document Type: Conference Paper

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