Ferroelectric field effect in ultrathin SrRuO3 films

Applied Physics Letters

Volumn 70, Issue 2, 1997, Pages 206-208

  Ahn, C H ^a   Hammond, R H ^a   Geballe, T H ^a   Beasley, M R ^a   Triscone, J M ^b   Decroux, M ^b   Fischer, O ^b   Antognazza, L ^c   Char, K ^c  

^a STANFORD UNIVERSITY   (United States)

^b UNIVERSITY OF GENEVA   (Switzerland)

^c Conductus Incorporated ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC FIELD EFFECTS; ELECTRIC RESISTANCE; FERMI LEVEL; FERROELECTRICITY; HALL EFFECT; LEAD COMPOUNDS; POLARIZATION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; STRONTIUM COMPOUNDS; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION;

CURIE TEMPERATURE; LEAD ZIRCONIUM TITANATE; RESIDUAL RESISTIVITY RATIO; STRONTIUM RUTHENIUM OXIDE;

ULTRATHIN FILMS;

EID: 0030737298     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118203     Document Type: Article

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