X-ray characterisation of chemical solution deposited PbTiO3 films with high Ca doping

Thin Solid Films

Volumn 450, Issue 1, 2004, Pages 211-215

  Calzada, M L ^a   Bretos, I ^a   Jimenez R ^a   Ricote, J ^a   Mendiola, J ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Dielectric; Ferroelectric; Perovskite; Thin film; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; DIELECTRIC MATERIALS; DOPING (ADDITIVES); GRAIN SIZE AND SHAPE; LEAD ALLOYS; PEROVSKITE; PRECIPITATION (CHEMICAL); SINGLE CRYSTALS; SOL-GELS; SPIN COATING; SPUTTERING; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION;

CHEMICAL SOLUTION DEPOSITION (CSD); CRYSTALLITE SIZE; TILTING;

THIN FILMS;

EID: 1242310490     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.10.076     Document Type: Conference Paper

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