On the effects of stresses in ferroelectric (Pb,Ca) Tio3 thin films

Thin Solid Films

Volumn 315, Issue 1-2, 1998, Pages 195-201

  Mendiola, J ^a   Calzada, M L ^a   Ramos, P ^a   Martin, M J ^a   Agullo Rueda F ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Dielectrics; Phase transition; Stress

Indexed keywords

AMORPHOUS FILMS; CRYSTAL ORIENTATION; CRYSTALLIZATION; FILM PREPARATION; HEAT TREATMENT; LEAD COMPOUNDS; PERMITTIVITY; RAMAN SPECTROSCOPY; SOL-GELS; TENSILE STRENGTH; THIN FILMS; X RAY DIFFRACTION;

GRAZING ANGLE X RAY DIFFRACTION; PROFILOMETRY; RAMAN SPECTROMETRY;

FERROELECTRIC MATERIALS;

EID: 0032473253     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00698-6     Document Type: Article

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