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1
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0028727361
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Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies
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Dec.
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J. S. Melinger, S. Buchner, D. McMorrow, W. J. Stapor, T. R. Weatherford, and A. B. Campbell, "Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies," IEEE Trans. Nucl. Sci., vol. 41, pp. 2574-2584, Dec. 1994.
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IEEE Trans. Nucl. Sci.
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Melinger, J.S.1
Buchner, S.2
McMorrow, D.3
Stapor, W.J.4
Weatherford, T.R.5
Campbell, A.B.6
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2
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0029516454
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Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures
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Dec.
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S. C. Moss, S. D. LaLumondiere, J. R. Scarpulla, K. P. MacWilliams, W. R. Crain, and R. Koga, "Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures," IEEE Trans. Nucl. Sci., vol. 42, pp. 1948-1956, Dec. 1995.
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Moss, S.C.1
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Macwilliams, K.P.4
Crain, W.R.5
Koga, R.6
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3
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0034206977
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Application of a pulsed laser for evaluation and optimization of SEU-hard designs
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June
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D. McMorrow, J. Melinger, S. Buchner, T. Scott, R. D. Brown, and N. Haddad, "Application of a pulsed laser for evaluation and optimization of SEU-hard designs," IEEE Trans. Nucl. Sci., vol. 47, pp. 559-565, June 2000.
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McMorrow, D.1
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Buchner, S.3
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Haddad, N.6
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4
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0032096141
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Charge-enhancement mechanisms of GaAs field-effect transistors: Experiment and simulation
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June
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D. McMorrow, J. S. Melinger, A. R. Knudson, S. Buchner, L. H. Tran, and A. B. Campbell, "Charge-enhancement mechanisms of GaAs field-effect transistors: experiment and simulation," IEEE Trans. Nucl. Sci., vol. 45, pp. 1494-1500, June 1998.
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McMorrow, D.1
Melinger, J.S.2
Knudson, A.R.3
Buchner, S.4
Tran, L.H.5
Campbell, A.B.6
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5
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0034450421
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Analysis of single event transients in analog circuits
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Dec.
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P. Adell, R. D. Schrimpf, H. J. Barnaby, R. Marec, C. Chatry, P. Calvel, C. Barillot, and O. Moi, "Analysis of single event transients in analog circuits," IEEE Trans. Nucl. Sci., vol. 47, pp. 2616-2623, Dec. 2000.
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Adell, P.1
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Chatry, C.5
Calvel, P.6
Barillot, C.7
Moi, O.8
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6
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0035720528
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Critical charge for single-event transients in bipolar linear circuits
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Dec.
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R. L. Pease, A. Stemberg, L. Massengill, R. Schrimpf, S. Buchner, M. Savage, J. Titus, and T. Turflinger, "Critical charge for single-event transients in bipolar linear circuits," IEEE Trans. Nucl. Sci., vol. 48, pp. 1966-1972, Dec. 2001.
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Pease, R.L.1
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Massengill, L.3
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Buchner, S.5
Savage, M.6
Titus, J.7
Turflinger, T.8
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7
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0036624502
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Single-event transient (SET) characterization of a LM119 voltage comparator: An approach to SET model validation using a pulsed laser
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June
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S. Buchner, D. McMorrow, A. Sternberg, L. Massengill, R. L. Pease, and M. Maher, "Single-event transient (SET) characterization of a LM119 voltage comparator: an approach to SET model validation using a pulsed laser," IEEE Trans. Nucl. Sci., vol. 49, pp. 1502-1508, June 2002.
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Buchner, S.1
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Maher, M.6
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8
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0036952716
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Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser and circuit simulation
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Dec.
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R. Pease, A. Sternberg, Y. Boulghassoul, L. Massengill, S. Buchner, D. McMorrow, D. Walsh, G. Hash, S. LaLumondiere, and S. Moss, "Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser and circuit simulation," IEEE Trans. Nucl. Sci., vol. 49, pp. 3163-3170, Dec. 2002.
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Pease, R.1
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McMorrow, D.6
Walsh, D.7
Hash, G.8
LaLumondiere, S.9
Moss, S.10
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9
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0036947788
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Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators
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Dec.
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S. D. LaLumondiere, R. Koga, P. Yu, M. C. Maher, and S. C. Moss, "Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators," IEEE Trans. Nucl. Sci., vol. 49, pp. 3121-3128, Dec. 2002.
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LaLumondiere, S.D.1
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Moss, S.C.5
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10
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0036956196
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Subbandgap laser-induced single event effects: Carrier ganeration via two-photon absorption
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Dec.
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D. McMorrow, W. T. Lotshaw, J. S. Melinger, S. Buchner, and R. L. Pease, "Subbandgap laser-induced single event effects: carrier ganeration via two-photon absorption," IEEE Trans. Nucl. Sci., vol. 49, pp. 3002-3008, Dec. 2002.
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McMorrow, D.1
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Pease, R.L.5
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11
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84967678516
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Ueber Elementarakte mi t zwei Quantenspruengen
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Two photon absorption, nonlinear refraction and optical limiting
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E. W. Van Stryland, H. Vanherzeele, M. A. Woodall, M. J. Soileau, A. L. Smirl, S. Guha, and T. F. Boggess, "Two photon absorption, nonlinear refraction and optical limiting," Opt. Eng., vol. 24, pp. 613-623, July/Aug. 1985.
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13
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0022665371
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Simutaneous measurement of the two-photon coefficient and free-carrier cross section above the bandgap of crystalling silicon
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Feb.
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T. F. Boggess, K. M. Bohnert, K. Mansour, S. C. Moss, I. W. Boyd, and A. L. Smirl, "Simutaneous measurement of the two-photon coefficient and free-carrier cross section above the bandgap of crystalling silicon," IEEE J. Quantum Electron., vol. 22, pp. 360-368, Feb. 1986.
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Smirl, A.L.6
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14
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0036950063
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Circuit modeling of the LM124 operational amplifier for single-event-transient prediction
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Y. Boulghassoul, L. Massengill, A. Sternberg, R. L. Pease, S. Buchner, J. W. Howard, D. McMorrow, M. W. Savage, and C. Poivey, "Circuit modeling of the LM124 operational amplifier for single-event-transient prediction," IEEE Trans. Nucl. Sci., vol. 49, pp. 3090-3096, 2002.
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Boulghassoul, Y.1
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Howard, J.W.6
McMorrow, D.7
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0016313596
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The monolithic op amp: A tutorial study
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Savage, M.1
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