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Volumn 1, Issue , 2003, Pages 147-153

Analysis of the micro- mechanical properties in aged lead-free, fine pitch flip chip joints

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; COMPOSITE MICROMECHANICS; ELECTROLESS PLATING; ELECTRON DEVICE MANUFACTURE; INTERFACES (MATERIALS); PRINTED CIRCUIT BOARDS; SHEAR STRENGTH; SOLDERING ALLOYS; CHIP SCALE PACKAGES; CONDUCTIVE FILMS; FLIP CHIP DEVICES; GRAIN GROWTH; INDENTATION; MECHANICAL PROPERTIES; PHASE INTERFACES; PRINTED CIRCUIT MANUFACTURE; SOLDERING; STRESS CONCENTRATION; TIN;

EID: 1242264774     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/ipack2003-35130     Document Type: Conference Paper
Times cited : (5)

References (8)
  • 3
    • 0037076832 scopus 로고    scopus 로고
    • Six cases of reliability study of Pb-free solder joints in electronic packaging technology
    • Zeng, K. and K. N. Tu, (2002). "Six cases of reliability study of Pb-free solder joints in electronic packaging technology." Materials Science and Engineering, R: Reports 38: 55-105.
    • (2002) Materials Science and Engineering, R: Reports , vol.38 , pp. 55-105
    • Zeng, K.1    Tu, K.N.2
  • 5
    • 0036292985 scopus 로고    scopus 로고
    • UBM (Under Bump Metallization) study for Pb-free electroplating bumping: Interface reaction and electromigration
    • New York, I E E E
    • Jang, S. Y., J. Wolf, W.S. Kwon, K.W. Paik, (2002). UBM (Under Bump Metallization) study for Pb-free electroplating bumping: Interface reaction and electromigration. 52nd Electronic Components & Technology Conference, 2002 Proceedings. New York, I E E E: 1213-1220.
    • (2002) 52nd Electronic Components & Technology Conference, 2002 Proceedings , pp. 1213-1220
    • Jang, S.Y.1    Wolf, J.2    Kwon, W.S.3    Paik, K.W.4
  • 6
    • 0036294956 scopus 로고    scopus 로고
    • Flip-chip reliability: Comparative characterization of lead free (Sn/Ag/Cu) and 63Sn/Pb eutectic solder
    • New York, I E E E
    • Balkan, H., D. Patterson, et al. (2002). Flip-chip reliability: Comparative characterization of lead free (Sn/Ag/Cu) and 63Sn/Pb eutectic solder. 52nd Electronic Components & Technology Conference, 2002 Proceedings. New York, I E E E: 1263-1269.
    • (2002) 52nd Electronic Components & Technology Conference, 2002 Proceedings , pp. 1263-1269
    • Balkan, H.1    Patterson, D.2
  • 8
    • 0036296077 scopus 로고    scopus 로고
    • Effect of Au on interfacial reactions of eutectic SnPb and SnAgCu solders with Al/Ni(V)/Cu thin film metallization
    • New York, IEEE
    • Zhang, F., C. C. Chum, M. Li, (2002). Effect of Au on interfacial reactions of eutectic SnPb and SnAgCu solders with Al/Ni(V)/Cu thin film metallization. 52nd Electronic Components & Technology Conference, 2002 Proceedings. New York, IEEE: 726-731.
    • (2002) 52nd Electronic Components & Technology Conference, 2002 Proceedings , pp. 726-731
    • Zhang, F.1    Chum, C.C.2    Li, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.