Dislocation-based models of stress-strain behavior in multilayered thin films

Materials Research Society Symposium - Proceedings

Volumn 505, Issue , 1998, Pages 571-576

  Anderson, Peter M ^a   Kreidler Jr , Eric R ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; DISLOCATIONS (CRYSTALS); INTERFACES (MATERIALS); MATHEMATICAL MODELS; MULTILAYERS; STRAIN; STRESS ANALYSIS;

ELEMENTARY DISLOCATION ARRAYS;

THIN FILMS;

EID: 0031617511     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)