Operation lifetimes of organic light-emitting devices with different layer structures

Chemical Physics Letters

Volumn 402, Issue 4-6, 2005, Pages 335-339

  Lee, Jiun Haw ^a   Huang, Jianjang ^a   Liao, Chi Chih ^b   Hu, Pier Jy ^b   Chang, Yih ^b  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b RiTdisplay Corporation   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; INTERFACES (MATERIALS); THICKNESS MEASUREMENT;

ELECTRON TRANSPORT LAYER (ETL); EMITTING LAYER (EL); HOLE-TRANSPORT LAYER (HTL); ORGANIC LIGHT EMITTING DIODES;

LIGHT EMITTING DIODES;

ARTICLE; CORRELATION ANALYSIS; DENSITY; ELECTRICITY; ELECTRON TRANSPORT; LIGHT EMITTING DIODE; MATHEMATICAL COMPUTING; THICKNESS;

EID: 12344290571     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2004.12.050     Document Type: Article

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