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Volumn 9, Issue 2 PART 2, 1999, Pages 1490-1493

Processing dependence of biaxial texture in yttria-stabilized zirconia by lon-beam-assisted deposition

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRON BEAMS; EVAPORATION; FILM GROWTH; ION BEAMS; ION BOMBARDMENT; TEXTURES; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS; ZIRCONIA;

EID: 0032655218     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.784675     Document Type: Article
Times cited : (13)

References (13)
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  • 4
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    • Theory of thin-film orientation by ion bombardment during deposition
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    • Bradley, R.1    Harper, J.2    Smith, D.3
  • 6
    • 0031257554 scopus 로고    scopus 로고
    • Mechanism of biaxial alignment of oxide thin films during ion-beam-assisted deposition
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  • 7
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    • Improvement of Jf-B characteristics in biaxially aligned YBa-Cu-O thin films on metallic substrates
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    • (1993) Appl. Supercond. , vol.1 , Issue.3-6 , pp. 645-651
    • Kohno, O.1    Lijima, Y.2    Onabe, K.3    Futaki, N.4    Sadakata, N.5    Tanabe, N.6    Ikeno, Y.7
  • 9
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    • Preparation of biaxially textured YSZ buffer layers on cylindrical curved substrates
    • Proc. EUCAS, 3ld European Conf. on Appl. Supercond., Inst. Phys. Pub., Philadelphia.
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    • Strucatural and transport properties of biaxially aligned YBajCu O,., films on polycrystalline Ni-based alloy with ion-beam-modified buffer layers
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.