메뉴 건너뛰기




Volumn 12, Issue 4, 2004, Pages 417-428

Generation-recombination effects in high temperature HgCdTe heterostructure photodiodes

Author keywords

Generation recombination effects; HgCdTe photodiodes; Poole Frankel effect

Indexed keywords

BAND STRUCTURE; DATA ACQUISITION; DISLOCATIONS (CRYSTALS); ELECTRIC FIELD EFFECTS; HETEROJUNCTIONS; PARTIAL DIFFERENTIAL EQUATIONS; PHONONS; PHOTODIODES;

EID: 11844264851     PISSN: 12303402     EISSN: 18963757     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (17)

References (30)
  • 1
    • 0038668533 scopus 로고    scopus 로고
    • HgCdTe infrared detectors
    • P. Norton, "HgCdTe infrared detectors", Opto-Electron. Rev. 10, 159-174 (2002).
    • (2002) Opto-electron. Rev. , vol.10 , pp. 159-174
    • Norton, P.1
  • 2
    • 0009041692 scopus 로고
    • Minority carrier lifetime in the region close to the interface between the anodic oxide CdHgTe
    • T. Yamamoto, Y. Miyamoto, and K. Tanikawa, "Minority carrier lifetime in the region close to the interface between the anodic oxide CdHgTe", J. Crystal Growth 72, 270-274 (1985).
    • (1985) J. Crystal Growth , vol.72 , pp. 270-274
    • Yamamoto, T.1    Miyamoto, Y.2    Tanikawa, K.3
  • 3
    • 36449004427 scopus 로고
    • Effect of the dislocation density on minority-carrier lifetime in molecular beam epitaxial HgCdTe
    • S.H. Shin, J.M. Arias, M. Zandian, J.G. Pasko, and R.E. DeWames, "Effect of the dislocation density on minority-carrier lifetime in molecular beam epitaxial HgCdTe", Appl. Phys. Lett. 59, 2718-2720 (1991).
    • (1991) Appl. Phys. Lett. , vol.59 , pp. 2718-2720
    • Shin, S.H.1    Arias, J.M.2    Zandian, M.3    Pasko, J.G.4    DeWames, R.E.5
  • 4
    • 0019601474 scopus 로고
    • Deep level studies of HgCdTe. I: Narrow-band-gap space-charge spectroscopy
    • D.L. Polla and C.E. Jones, "Deep level studies of HgCdTe. I: Narrow-band-gap space-charge spectroscopy", J. Appl. Phys. 52, 5118-5131 (1981).
    • (1981) J. Appl. Phys. , vol.52 , pp. 5118-5131
    • Polla, D.L.1    Jones, C.E.2
  • 5
    • 0019599415 scopus 로고
    • Deep level studies of HgCdTe. II: Correlation with photodiode performance
    • D.L. Polla, M.B. Reine, and C.E. Jones, "Deep level studies of HgCdTe. II: Correlation with photodiode performance", J. Appl. Phys. 52, 5132-5138 (1981).
    • (1981) J. Appl. Phys. , vol.52 , pp. 5132-5138
    • Polla, D.L.1    Reine, M.B.2    Jones, C.E.3
  • 7
    • 0041058318 scopus 로고
    • Minority-carrier lifetime in p-type (111)B HgCdTe grown by molecular-beam epitaxy
    • M.E. de Souza, M. Boukerche, and J. P. Faurie, "Minority-carrier lifetime in p-type (111)B HgCdTe grown by molecular-beam epitaxy", J. Appl. Phys. 68, 5195-5199 (1990).
    • (1990) J. Appl. Phys. , vol.68 , pp. 5195-5199
    • De Souza, M.E.1    Boukerche, M.2    Faurie, J.P.3
  • 8
    • 0002342842 scopus 로고
    • The excess carrier lifetime in vacancy- and impurity-doped HgCdTe
    • R. Fastow and Y. Nemirovsky, "The excess carrier lifetime in vacancy- and impurity-doped HgCdTe", J. Vac. Sci. Technol. A8, 1245-1250 (1990).
    • (1990) J. Vac. Sci. Technol. , vol.A8 , pp. 1245-1250
    • Fastow, R.1    Nemirovsky, Y.2
  • 9
    • 0000938565 scopus 로고    scopus 로고
    • Key performance-limiting defects in p-on-n HgCdTe heterojunction infrared photodiodes
    • M.C. Chen, R.S. List, D. Chandra, M.J. Bevan, L. Colombo, and H.F. Schaake, "Key performance-limiting defects in p-on-n HgCdTe heterojunction infrared photodiodes", J. Electron. Mater. 25, 1375-1382 (1996).
    • (1996) J. Electron. Mater. , vol.25 , pp. 1375-1382
    • Chen, M.C.1    List, R.S.2    Chandra, D.3    Bevan, M.J.4    Colombo, L.5    Schaake, H.F.6
  • 12
    • 84944483089 scopus 로고
    • Theory of the electrons and holes in germanium and other semiconductors
    • W. Van Roosbroeck, "Theory of the electrons and holes in germanium and other semiconductors", Bell Syst. Tech. J. 29, 560-607 (1950).
    • (1950) Bell Syst. Tech. J. , vol.29 , pp. 560-607
    • Van Roosbroeck, W.1
  • 14
    • 84916430884 scopus 로고
    • A self-consistent iterative scheme for one-dimensional steady state transistor calculations
    • H.K. Gummel, "A self-consistent iterative scheme for one-dimensional steady state transistor calculations", IEEE Trans. Electron Devices ED 11, 455-465 (1964).
    • (1964) IEEE Trans. Electron Devices ED , vol.11 , pp. 455-465
    • Gummel, H.K.1
  • 15
    • 0009540733 scopus 로고
    • An accurate numerical steady-state one-dimensional solution of the p-n junction
    • A. De Mari, "An accurate numerical steady-state one-dimensional solution of the p-n junction", Solid State Electronics 11, 33-58 (1968).
    • (1968) Solid State Electronics , vol.11 , pp. 33-58
    • De Mari, A.1
  • 16
    • 11844289492 scopus 로고    scopus 로고
    • Dawn Technologies, Inc. California
    • Software: Semicond Devices, Dawn Technologies, Inc. California.
    • Software: Semicond Devices
  • 17
    • 11844267094 scopus 로고    scopus 로고
    • Crosslight Software, Inc. Ontario, Canada
    • Software: Apsys, Crosslight Software, Inc. Ontario, Canada.
    • Software: Apsys
  • 18
    • 0032684613 scopus 로고    scopus 로고
    • Computer simulation of HgCdTe photovoltaic devices based on complex heterostructures
    • K. Jóźwikowski, J. Piotrowski, K. Adamiec, and A. Rogalski, "Computer simulation of HgCdTe photovoltaic devices based on complex heterostructures", Proc. SPIE 3629, 74-80 (1999).
    • (1999) Proc. SPIE , vol.3629 , pp. 74-80
    • Jóźwikowski, K.1    Piotrowski, J.2    Adamiec, K.3    Rogalski, A.4
  • 19
    • 0342420649 scopus 로고    scopus 로고
    • Computer simulation of non-cooled long wavelength multi-junction (Cd,Hg)Te photodiodes
    • K. Jóźwikowski, "Computer simulation of non-cooled long wavelength multi-junction (Cd,Hg)Te photodiodes", Infrared Phys. & Technol. 41, 353-359 (2000).
    • (2000) Infrared Phys. & Technol. , vol.41 , pp. 353-359
    • Jóźwikowski, K.1
  • 20
    • 0342955059 scopus 로고    scopus 로고
    • Effect of dislocations on performance of LWIR HgCdTe photodiodes
    • K. Jóźwikowski and A. Rogalski, "Effect of dislocations on performance of LWIR HgCdTe photodiodes", J. Electron. Mater. 29, 736-741 (2000).
    • (2000) J. Electron. Mater. , vol.29 , pp. 736-741
    • Jóźwikowski, K.1    Rogalski, A.2
  • 21
    • 0035424219 scopus 로고    scopus 로고
    • Computer modelling of dual-band HgCdTe photovoltaic detectors
    • K. Jóźwikowski and A. Rogalski, "Computer modelling of dual-band HgCdTe photovoltaic detectors", J. Appl. Phys. 90, 1286-1291 (2001).
    • (2001) J. Appl. Phys. , vol.90 , pp. 1286-1291
    • Jóźwikowski, K.1    Rogalski, A.2
  • 24
    • 0001653076 scopus 로고
    • Effect of dislocations on the electrical and optical properties of long-wavelength infrared HgCdTe photovoltaic detectors
    • S.M. Johnson, D.R. Rhiger, J.P. Rosbeck, J.M. Peterson, S.M. Taylor, and M.E. Boyd, "Effect of dislocations on the electrical and optical properties of long-wavelength infrared HgCdTe photovoltaic detectors", J. Vac. Sci. Technol. B10, 1499-1506 (1992).
    • (1992) J. Vac. Sci. Technol. , vol.B10 , pp. 1499-1506
    • Johnson, S.M.1    Rhiger, D.R.2    Rosbeck, J.P.3    Peterson, J.M.4    Taylor, S.M.5    Boyd, M.E.6
  • 25
    • 0342955059 scopus 로고    scopus 로고
    • Effect of dislocations on performance of LWIR HgCdTe photodiodes
    • K. Jóźwikowski and A. Rogalski, "Effect of dislocations on performance of LWIR HgCdTe photodiodes", J. Electron. Mater. 29, 736-741 (2000).
    • (2000) J. Electron. Mater. , vol.29 , pp. 736-741
    • Jóźwikowski, K.1    Rogalski, A.2
  • 26
    • 0034461536 scopus 로고    scopus 로고
    • The influence of dislocations on generation-recombination process in narrow-bandgap semiconductor
    • K. Jóźwikowski and T. Niedziela, "The influence of dislocations on generation-recombination process in narrow-bandgap semiconductor", Electron Technology 33, 518-528 (2000).
    • (2000) Electron Technology , vol.33 , pp. 518-528
    • Jóźwikowski, K.1    Niedziela, T.2
  • 27
    • 4243952738 scopus 로고
    • Transient-current study of field-assisted emission from shallow levels in silicon
    • E. Rosencher, V. Mosser, and G. Vincent, "Transient-current study of field-assisted emission from shallow levels in silicon", Phys. Rev. B29, 1135-1147 (1984).
    • (1984) Phys. Rev. , vol.B29 , pp. 1135-1147
    • Rosencher, E.1    Mosser, V.2    Vincent, G.3
  • 28
    • 36849099660 scopus 로고
    • The three-dimensional Poole-Frenkel effect
    • J.L. Harthe, "The three-dimensional Poole-Frenkel effect", J. Appl. Phys. 39, 4871-4873 (1968).
    • (1968) J. Appl. Phys. , vol.39 , pp. 4871-4873
    • Harthe, J.L.1
  • 29
    • 0019708359 scopus 로고
    • Electric field enhanced emission from non-Coulombic traps in semiconductors
    • P.A. Martin, B.G. Streetman, and K. Hess, "Electric field enhanced emission from non-Coulombic traps in semiconductors", J. Appl. Phys. 52, 7409-7415 (1981).
    • (1981) J. Appl. Phys. , vol.52 , pp. 7409-7415
    • Martin, P.A.1    Streetman, B.G.2    Hess, K.3
  • 30
    • 0001431610 scopus 로고
    • Statistics of the occupation of dislocation acceptor centres
    • W.T. Read, "Statistics of the occupation of dislocation acceptor centres", Phil. Mag. 45, 1119-1128 (1954).
    • (1954) Phil. Mag. , vol.45 , pp. 1119-1128
    • Read, W.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.