Charge carrier mobility in field effect transistors: Analysis of capacitance-conductance measurements

Semiconductor Science and Technology

Volumn 20, Issue 1, 2005, Pages 90-94

  Katz, O ^a   Roichman, Y ^a   Bahir, G ^a   Tessler, N ^a   Salzman, J ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CARRIER CONCENTRATION; CARRIER MOBILITY; CHARGE CARRIERS; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC FIELDS; GALLIUM NITRIDE; HETEROJUNCTIONS; ORGANIC POLYMERS; SEMICONDUCTING ALUMINUM COMPOUNDS; SILICON;

CHARGE CARRIER MOBILITY; CHARGE CONCENTRATION; DRAIN VOLTAGE; INTRINSIC EFFECTS;

FIELD EFFECT TRANSISTORS;

EID: 11844259423     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/20/1/015     Document Type: Article

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