Interdiffusion in GaAs(1-x)Sbx/GaAs superlattices studied with high-resolution x-ray diffraction and secondary ion mass spectroscopy

Journal of Applied Physics

Volumn 84, Issue 5, 1998, Pages 2546-2550

  Senz, S ^a   Egger, U ^a,c   Schultz, M ^a   Gosele U ^a   Lto, H ^b  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b NTT CORPORATION   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11644255622     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368416     Document Type: Article

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