Surface-plasmon-resonance-enhanced cavity ring-down detection

Journal of Chemical Physics

Volumn 120, Issue 3, 2004, Pages 1585-1593

  Pipino, Andrew C R ^a   Woodward, John T ^a   Meuse, Curtis W ^a   Silin, Vitalii ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ETHYLENE; GOLD; NANOSTRUCTURED MATERIALS; OPTICAL PARAMETRIC OSCILLATORS; OPTICAL RESONATORS; PARTICLE SIZE ANALYSIS; PROBES; SENSITIVITY ANALYSIS; SURFACE PLASMON RESONANCE; ULTRATHIN FILMS;

CAVITY RING DOWN DETECTION; MIE THEORY; PERCHCHLOETHYLENE; SIZE DISPERSION EFFECTS; TRICHLOROETHYLENE;

ADSORPTION;

EID: 1142279631     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1629279     Document Type: Article

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