Evanescent wave cavity ring-down spectroscopy for probing surface processes

Chemical Physics Letters

Volumn 280, Issue 1-2, 1997, Pages 104-112

  Pipino, Andrew C R ^a   Hudgens, Jeffrey W ^a   Huie, Robert E ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001270478     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(97)01080-4     Document Type: Article

References (36)

1. Delange O.E. Bell Syst. Tech. J. 44:1965;283.
2. O'Keefe A., Deacon D.A.G. Rev. Sci. Instrum. 59:1988;2544.
3. Romanini D., Lehmann K.K. J. Chem. Phys. 99:1993;6287.
4. Wahl E.H., Owano T.G., Kruger C.H., Zalicki P., Ma Y., Zare R.N. Diamond Relat. Mater. 5:1996;373.
5. Romanini D., Lehmann K.K. J. Chem. Phys. 105:1996;68.
6. Pearson J., Orr-Ewing A.J., Ashfold M.N.R., Dixon R.N. J. Chem. Soc. Faraday Trans. 92:1996;1283.
7. Zalicki P., Ma Y., Zare R.N., Wahl E.H., Dadamio J.R., Owano T.G., Kruger C.H. Chem. Phys. Lett. 234:1995;269.
8. Scherer J.J., Paul J.B., Collier C.P., Saykally R.J. J. Chem. Phys. 102:1995;5190.
9. Huestis D.L., Copeland R.A., Knutsen K., Slanger T.G., Jongma R.T., Boogaarts M.G.H., Meijer G. Can. J. Phys. 72:1994;1109.
10. Zhu L., Kellis D., Ding C.F. Chem. Phys. Lett. 257:1996;487.
11. Yu T., Lin M.C. J. Phys. Chem. 99:1995;8599.
12. Diau E.W., Yu T., Wagner M.A.G., Lin M.C. J. Phys. Chem. 98:1994;4043.
13. Atkinson D.B., Hudgens J.W. J. Phys. Chem. A. 101:1997;3901.
14. Meijer G., Boogaarts M.G.H., Jongma R.T., Parker D.H. Chem. Phys. Lett. 217:1994;112.
15. Scherer J.J., Voelkel D., Rakestraw D.J., Paul J.B., Collier C.P., Saykally R.J., O'Keefe A. Chem. Phys. Lett. 245:1995;273.
16. Engeln R., Meijer G. Rev. Sci. Instrum. 67:1996;2708.
17. Meijer G., Engeln R. Chem. Phys. Lett. 262:1996;105.
18. Romanini D., Kacchanov A.A., Stoeckel F. Chem. Phys. Lett. 264:1997;316.
19. B.A. Paldus, J.S. Harris, J. Martin, J. Xie, R.N. Zare, J. Appl. Phys. (in press).
20. Pipino A.C.R., Hudgens J.W., Huie R.E. Rev. Sci. Instrum. 68:1997;2978.
21. J.J. Regan, D.R. Andersen, Comput. Phys. 49 (1991) (Jan./Feb.).
22. N.J. Harrick, Internal Reflection Spectroscopy, Interscience, New York, 1967.
23. Reader J. Appl. Opt. 12:1973;1405.
24. A.E. Seigman, Lasers, University Science Books, Mills Valley, CA, 1986.
25. Hodges J.T., Looney J.P., Van Zee R.D. J. Chem. Phys. 105:1996;10278.
26. An.N. Nesmeyanov, Vapour Pressure of the Elements, Academic Press, New York, 1963.
27. Jones M.W., Kao K.C. J. Phys. E. 2:1969;331.
28. Kienzle O., Staub J., Tschudi T. Meas. Sci. Tech. 5:1994;747.
29. C. Terpstra, private communication, Research Electro-Optics, Boulder, CO.
30. Chipman R.A. Opt. Eng. 28:1989;90.
31. J.G. Calvert, J.N. Pitts, Jr., Photochemistry, Wiley, New York, 1967.
32. R.M.A. Azzam, N.M. Basharsa, Ellipsometry and Polarized Light, North-Holland Publishing Co., New York, 1977.
33. Kortum G., Koffer H. Ber. Bunsenges. Phys. Chem. 67:1963;67.
34. Yamamoto I., Tanaka A., Endo H. J. Non-Cryst. Solids. 156 157 158:1993;728.
35. Nagasao T., Yamada H. J. Raman Spectrosc. 3:1975;153.
36. J.T. Hougen, private communication.