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Volumn 299-302, Issue PART 1, 2002, Pages 610-614
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Bulk and surface defects in a-Si:H films studied by means of the cavity ring down absorption technique
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS FILMS;
CHEMICAL BONDS;
CRYSTAL DEFECTS;
DEPOSITION;
ENERGY GAP;
HYDROGENATION;
LIGHT ABSORPTION;
PARAMAGNETIC RESONANCE;
PHOTOCONDUCTIVITY;
PHOTOCURRENTS;
SPECTROSCOPIC ANALYSIS;
THIN FILMS;
DUAL BEAM PHOTOCONDUCTIVITIES (DBP);
PHOTOTHERMAL DEFLECTION SPECTROSCOPY (PDS);
AMORPHOUS SILICON;
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EID: 0036539694
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(01)01026-2 Document Type: Conference Paper |
Times cited : (15)
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References (15)
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