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Volumn 299-302, Issue PART 1, 2002, Pages 610-614

Bulk and surface defects in a-Si:H films studied by means of the cavity ring down absorption technique

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CHEMICAL BONDS; CRYSTAL DEFECTS; DEPOSITION; ENERGY GAP; HYDROGENATION; LIGHT ABSORPTION; PARAMAGNETIC RESONANCE; PHOTOCONDUCTIVITY; PHOTOCURRENTS; SPECTROSCOPIC ANALYSIS; THIN FILMS;

EID: 0036539694     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(01)01026-2     Document Type: Conference Paper
Times cited : (15)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.