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Surface Review and Letters

Volumn 11, Issue 1, 2004, Pages 21-25

Ethylene reactivity with silicon surface

(2) Zaibi M A a Lacharme, J P b

a Struggle and Prevention (Tunisia)

b UNIVERSITÉ PIERRE ET MARIE CURIE (France)

Author keywords

Adsorption; Ethylene; Scattering; Silicon; Surface

Indexed keywords

ADSORPTION; AUGER ELECTRON SPECTROSCOPY; ELECTRONS; HYDROGEN; LOW ENERGY ELECTRON DIFFRACTION; MOLECULES; PHOTOEMISSION; RATE CONSTANTS; SILICON; ULTRAHIGH VACUUM;

PHOTOEMISSION YIELD SPECTROSCOPY (PYS); PHOTOEMITTED ELECTRONS; STICKING COEFFICIENTS; VALENCE BANDS;

ETHYLENE;

ETHYLENE; SILICON;

ADSORPTION; ARTICLE; AUGER ELECTRON SPECTROSCOPY; CALCULATION; CHEMICAL BOND; ELECTRON; ELECTRONICS; ENERGY; MATHEMATICAL ANALYSIS; REACTION ANALYSIS; SURFACE PROPERTY; VACUUM;

EID: 11144355753 PISSN: 0218625X EISSN: None Source Type: Journal
DOI: 10.1142/S0218625X04005834 Document Type: Article

Times cited : (3)

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