Adsorption of acetylene and ethylene on the Si(001)2 x 1 surface studied by NEXAFS and UPS

Surface Science

Volumn 401, Issue 2, 1998, Pages

  Matsui, F ^a   Yeom, H W ^a   Imanishi, A ^a   Isawa, K ^a   Matsuda, I ^a   Ohta, T ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Alkenes; Alkynes; Chemisorption; Near edge X ray absorption fine structure; Silicon; Ultraviolet photoemission spectroscopy

Indexed keywords

ACETYLENE; ADSORPTION; CHEMICAL BONDS; CHEMISORPTION; CRYSTAL ORIENTATION; ELECTROMAGNETIC WAVE ABSORPTION; ETHYLENE; PHOTOEMISSION; SURFACE STRUCTURE; SYNCHROTRON RADIATION; ULTRAVIOLET SPECTROSCOPY; X RAY ANALYSIS;

NEAR EDGE X RAY ABSORPTION FINE STRUCTURE (NEXAFS); ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY (UPS);

SILICON;

EID: 0032045933     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00038-7     Document Type: Article

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