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Volumn 377-379, Issue , 1997, Pages 192-196

Residual gap surface states along variously hydrogenated silicon (111) and (100) surfaces

(3) Akremi, A a,b Lacharme, J P a Sebenne C A a

Author keywords

Hydrogen; Low index single crystal surfaces; Photoemission; Semiconducting surfaces; Silicon; Surface electronic phenomena

Indexed keywords

CHEMICAL MODIFICATION; ELECTRON SCATTERING; ELECTRONIC DENSITY OF STATES; ENERGY GAP; HYDROGEN; HYDROGENATION; LOW ENERGY ELECTRON DIFFRACTION; PHOTOEMISSION; SINGLE CRYSTALS; SURFACE PHENOMENA;

SURFACE ELECTRONIC PHENOMENA;

SEMICONDUCTING SILICON;

EID: 17644433492 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(96)01345-3 Document Type: Article

Times cited : (7)

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