Lifetime estimates and unique failure mechanisms of the Digital Micromirror Device (DMD)

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1998, Pages 9-16

  Douglass, M R ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DEVICE TESTING; FAILURE ANALYSIS; MIRRORS; RELIABILITY;

DIGITAL MICROMIRROR DEVICES (DMD); RELIABILITY TESTING;

DIGITAL DEVICES;

EID: 0031649731     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/relphy.1998.670436     Document Type: Conference Paper

References (7)