Sense amplifier based RADHARD flip flop design

IEEE Transactions on Nuclear Science

Volumn 51, Issue 6 II, 2004, Pages 3811-3815

  Wang, Weizhong ^a   Gong, Haiyan ^a  

^a University of Wisconsin Milwaukee   (United States)

Author keywords

Digital circuits; Radiation hardening (RADHARD); Registers; Sequential logic circuit fault tolerance; Single event effects (SEEs); Single event transients (SETs)

Indexed keywords

AMPLIFIERS (ELECTRONIC); CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DATA STORAGE EQUIPMENT; ELECTRIC POTENTIAL; FIELD EFFECT TRANSISTORS; FLIP FLOP CIRCUITS; MICROPROCESSOR CHIPS;

RADIATION HARDENING (RADHARD); REGISTERS; SEQUENTIAL LOGIC CIRCUIT FAULT TOLERANCE; SINGLE-EVENT EFFECTS (SEE); SINGLE-EVENT TRANSIENTS (SET);

DIGITAL CIRCUITS;

EID: 11044223544     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839149     Document Type: Conference Paper

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