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Volumn 3, Issue , 2004, Pages 1545-1551

Design and optimization of embedded power chip modules for double-sided cooling

Author keywords

[No Author keywords available]

Indexed keywords

COOLING; ELECTRONICS PACKAGING; EMBEDDED SYSTEMS; ENCAPSULATION; HEATING; INSULATING MATERIALS; MOSFET DEVICES; THERMAL GRADIENTS; THERMOANALYSIS; THERMOELECTRICITY;

EID: 10944250961     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (10)
  • 1
    • 0033343303 scopus 로고    scopus 로고
    • Power electronics technology at the dawn of the new millenium-status and future
    • PESC 99. Aug 1999
    • J.D. Van Wyk, F.C. Lee, "Power electronics technology at the dawn of the new millenium-status and future", Proceeding, IEEE, Power Electronics Specialists Conference, 1999. PESC 99. Aug 1999, vol.1, pp. 3-12
    • (1999) Proceeding, IEEE, Power Electronics Specialists Conference , vol.1 , pp. 3-12
    • Van Wyk, J.D.1    Lee, F.C.2
  • 2
    • 0038012416 scopus 로고    scopus 로고
    • Planar metallization interconnected 3-D multi-chip module
    • rd Electronic Components and Technology Conference, New Orleans, May
    • rd Electronic Components and Technology Conference, New Orleans, May 2003, pp. 1090-1094.
    • (2003) Proc. of ECTC'03 , pp. 1090-1094
    • Liang, Z.1    Van Wyk, J.D.2
  • 3
    • 0032204042 scopus 로고    scopus 로고
    • Thermal resistance analysis by induced transient (TRAIT) method for power electronics devices thermal characterization-part I: Fundamentals and theory
    • P.E. Bagnoli, C. Casarosa, M. Ciampi, "Thermal resistance analysis by induced transient (TRAIT) method for power electronics devices thermal characterization-part I: Fundamentals and theory," IEEE Trans. Power Electron., vol. 13, pp.1208-1219.
    • IEEE Trans. Power Electron. , vol.13 , pp. 1208-1219
    • Bagnoli, P.E.1    Casarosa, C.2    Ciampi, M.3
  • 4
    • 0032202670 scopus 로고    scopus 로고
    • Thermal resistance analysis by induced transient (TRAIT) method for power electronics devices thermal characterization-part II: Practice and Experiments
    • P.E. Bagnoli, C. Casarosa, M. Ciampi, "Thermal resistance analysis by induced transient (TRAIT) method for power electronics devices thermal characterization-part II: Practice and Experiments," IEEE Trans. Power Electron., vol. 13, pp.1220-1228.
    • IEEE Trans. Power Electron. , vol.13 , pp. 1220-1228
    • Bagnoli, P.E.1    Casarosa, C.2    Ciampi, M.3
  • 5
    • 0036455583 scopus 로고    scopus 로고
    • Emerging MOSFET packaging technologies and their thermal evaluation
    • ITHERM 2002
    • Xuejun Fan, Haque, S, "Emerging MOSFET packaging technologies and their thermal evaluation", ITHERM 2002, The Eighth Intersociety Conference, 2002, pp. 1102 -1108.
    • (2002) The Eighth Intersociety Conference , pp. 1102-1108
    • Fan, X.1    Haque, S.2
  • 6
    • 10944254779 scopus 로고    scopus 로고
    • Comparison of transient thermal parameters for different die connecting approaches
    • Industry Applications Conference, 2003
    • J. Yin, J. D. van Wyk, W.G. Odendaal and Z. Liang, "Comparison of transient thermal parameters for different die connecting approaches", Industry Applications Conference, 2003. 38th IAS Annual Meeting, vol. 1, 2003, pp. 222-226.
    • (2003) 38th IAS Annual Meeting , vol.1 , pp. 222-226
    • Yin, J.1    Van Wyk, J.D.2    Odendaal, W.G.3    Liang, Z.4
  • 8
    • 0032310009 scopus 로고    scopus 로고
    • On-line estimation of IGBT junction temperature using on-state voltage drop
    • Yong-Seok Kim, Seung-Ki Sul, "On-line Estimation of IGBT Junction Temperature Using On-state Voltage Drop" IEEE Industry Applications Conference, 1998, vol.2, pp. 853-859.
    • (1998) IEEE Industry Applications Conference , vol.2 , pp. 853-859
    • Kim, Y.-S.1    Sul, S.-K.2
  • 9
    • 10944225904 scopus 로고    scopus 로고
    • Thermal joint conductance
    • Aug.
    • E. Marotta and J. Norley, "Thermal joint conductance", ElectronicsCooling, vol. 8, no. 3, Aug. 2002, pp. 16-20.
    • (2002) ElectronicsCooling , vol.8 , Issue.3 , pp. 16-20
    • Marotta, E.1    Norley, J.2
  • 10
    • 33846568303 scopus 로고    scopus 로고
    • Calculation comer: The 45° heat spreading angle - An urban legend?
    • Nov.
    • B. M. Guenin, "Calculation comer: the 45° heat spreading angle - an urban legend? ", ElectronicsCooling, vol. 9, no. 4, Nov. 2003, pp. 10-12.
    • (2003) ElectronicsCooling , vol.9 , Issue.4 , pp. 10-12
    • Guenin, B.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.