On-line estimation of IGBT junction temperature using on-state voltage drop

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 2, Issue , 1998, Pages 853-859

  Kim, Yong Seok ^a   Sul, Seung Ki ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; COMPUTER SIMULATION; GATES (TRANSISTOR); PASSIVE NETWORKS; SEMICONDUCTOR DEVICE TESTING; TEMPERATURE CONTROL; TEMPERATURE MEASUREMENT;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

SEMICONDUCTOR JUNCTIONS;

EID: 0032310009     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)