Thermal Resistance Analysis By Induced Transient (TRAIT) method for power electronic devices thermal characterization - Part I: Fundamentals and theory

IEEE Transactions on Power Electronics

Volumn 13, Issue 6, 1998, Pages 1208-1219

  Bagnoli, Paolo Emilio ^b   Casarosa, Claudio ^b   Ciampi, Mario ^b   Dallago, Enrico ^a,c  

^a IEEE

^b UNIVERSITY OF PISA   (Italy)

^c UNIVERSITY OF PAVIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC NETWORK ANALYSIS; ELECTRONICS PACKAGING; EQUIVALENT CIRCUITS; HEAT RESISTANCE; TEMPERATURE MEASUREMENT; THERMOANALYSIS;

EQUIVALENT THERMAL CIRCUITS; THERMAL RESISTANCE ANALYSIS BY INDUCED TRANSIENT (TRAIT) METHODS;

POWER ELECTRONICS;

EID: 0032204042     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/63.728348     Document Type: Article

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