Imaging of oxide dielectrics by near-field microwave microscopy

Journal of the European Ceramic Society

Volumn 25, Issue 4, 2005, Pages 407-416

  Zhang, Qinxin ^a   McGinn, Paul J ^a  

^a UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

Dielectric properties; LaAlO3; Microstructure; Near field microwave microscopy; TiO2

Indexed keywords

GRAIN BOUNDARIES; IMAGE QUALITY; MICROSTRUCTURE; OXIDES; PERMITTIVITY; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; YTTRIUM COMPOUNDS;

MICROSTRUCTURAL FEATURES; NEAR-FIELD MICROWAVE MICROSCOPY; YTTRIA-STABILIZED ZIRCONIA (YSZ);

DIELECTRIC MATERIALS;

CERAMICS;

EID: 10944237262     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2004.02.013     Document Type: Article

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