Dielectric morphology of twin domains in LaAlO3 observed by a scanning microwave microscope

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 11, 2001, Pages 6510-6513

  Yanase, Satoshi ^a,b   Ouchi, Kazuhiro ^b   Sato, Susumu ^a  

^a AKITA UNIVERSITY   (Japan)

^b Akita Research Institute of Advanced Technology   (Japan)

Author keywords

Dielectric constant; Ferroelastic; LaAlO3; Scanning microwave microscope; Strain; Twin domains

Indexed keywords

FERROELECTRICITY; MICROSCOPIC EXAMINATION; MICROWAVES; MORPHOLOGY; OPTICAL MICROSCOPY; PERMITTIVITY; PHASE TRANSITIONS; SINGLE CRYSTALS; STRAIN; TWINNING; VARIABLE FREQUENCY OSCILLATORS; X RAY DIFFRACTION ANALYSIS;

DIELECTRIC MORPHOLOGY; LANTHANUM ALUMINUM OXIDE; NEAR FIELD SCANNING OPTICAL MICROSCOPE; SCANNING MICROWAVE MICROSCOPE; TWIN DOMAINS;

LANTHANUM COMPOUNDS;

EID: 0036150575     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)