Structural characterization of TiO 2 /TiN x O y (δ-doping) heterostructures on (1 1 0)TiO 2 substrates

Applied Surface Science

Volumn 212-213, Issue SPEC., 2003, Pages 661-666

  Chiaramonte, T ^a   Cardoso, L P ^a   Gelamo, R V ^a   Fabreguette, F ^b   Sacilotti, M ^b   Marco de Lucas, M C ^b   Imhoff, L ^b   Bourgeois, S ^b   Kihn, Y ^c   Casanove, M J ^c  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b UNIVERSITÉ DE BOURGOGNE   (France)

^c CEMES CNRS   (France)

Author keywords

MOCVD; Multilayers; Nanometric films; Titanium oxinitride; X ray diffraction

Indexed keywords

DOPING (ADDITIVES); ELECTRON ENERGY LOSS SPECTROSCOPY; HETEROJUNCTIONS; HIGH RESOLUTION ELECTRON MICROSCOPY; METALLORGANIC VAPOR PHASE EPITAXY; MOLECULAR ORIENTATION; MULTILAYERS; X RAY DIFFRACTION ANALYSIS;

NANOMETRIC FILMS;

TITANIUM DIOXIDE;

EID: 10744230815     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00019-9     Document Type: Conference Paper

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