메뉴 건너뛰기




Volumn 25, Issue 12, 2004, Pages 769-771

Extraction of the average collector velocity in high-speed " Type-II" InP-GaAsSb-InP DHBTs

Author keywords

GaAsSb; Heterojunction bipolar transistors (HBTs); Indium phosphide

Indexed keywords

CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 10644289529     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2004.838553     Document Type: Article
Times cited : (28)

References (14)
  • 2
    • 0242412463 scopus 로고    scopus 로고
    • "Type-II base-collector performance advantages and limitations in high-speed NpN double heterojunction bipolar transistors (DHBTs)"
    • C. R. Bolognesi, M. W. Dvorak, and S. P. Watkins, "Type-II base-collector performance advantages and limitations in high-speed NpN double heterojunction bipolar transistors (DHBTs)," IEICE Trans. Electron., vol. E86-C, pp. 1929-1934, 2003.
    • (2003) IEICE Trans. Electron. , vol.E86-C , pp. 1929-1934
    • Bolognesi, C.R.1    Dvorak, M.W.2    Watkins, S.P.3
  • 3
    • 0025419251 scopus 로고
    • "Collector signal delay in the presence of velocity overshoot"
    • Feb
    • S. E. Laux and W. Lee, "Collector signal delay in the presence of velocity overshoot," IEEE Electron Device Lett., vol. 11, pp. 174-176, Feb. 1990.
    • (1990) IEEE Electron. Device Lett. , vol.11 , pp. 174-176
    • Laux, S.E.1    Lee, W.2
  • 4
    • 0025485198 scopus 로고
    • "Influence of electron velocity overshoot on collector transit times of HBTs"
    • Dec
    • T. Ishibashi, "Influence of electron velocity overshoot on collector transit times of HBTs," IEEE Trans. Electron Devices, vol. 37, pp. 2103-2105, Dec. 1990.
    • (1990) IEEE Trans. Electron. Devices , vol.37 , pp. 2103-2105
    • Ishibashi, T.1
  • 9
    • 0005323136 scopus 로고    scopus 로고
    • "Technique for measurement of the minority carrier mobility with a bipolar junction transistor"
    • S. L. D'Souza, M. R. Melloch, M. S. Lundstrom, and E. S. Harmon, "Technique for measurement of the minority carrier mobility with a bipolar junction transistor," Appl. Phys. Lett., vol. 70, pp. 475-477, 1997.
    • (1997) Appl. Phys. Lett. , vol.70 , pp. 475-477
    • D'Souza, S.L.1    Melloch, M.R.2    Lundstrom, M.S.3    Harmon, E.S.4
  • 10
    • 36449009427 scopus 로고
    • "Majority and minority electron and hole mobilities in heavily doped GaAs"
    • J. R. Lowney and H. R. Bennett, "Majority and minority electron and hole mobilities in heavily doped GaAs," J. Appl. Phys., vol. 69, pp. 7102-7110, 1991.
    • (1991) J. Appl. Phys. , vol.69 , pp. 7102-7110
    • Lowney, J.R.1    Bennett, H.R.2
  • 11
    • 0006733776 scopus 로고
    • "Measurement of the minority carrier mobility in the base of heterojunction bipolar transistors using a magnetotransport method"
    • Y. Betser, D. Ritter, G. Bahir, S. Cohen, and I. Sperling, " Measurement of the minority carrier mobility in the base of heterojunction bipolar transistors using a magnetotransport method," Appl. Phys. Lett., vol. 67, pp. 1883-1884, 1995.
    • (1995) Appl. Phys. Lett. , vol.67 , pp. 1883-1884
    • Betser, Y.1    Ritter, D.2    Bahir, G.3    Cohen, S.4    Sperling, I.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.