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Volumn 37, Issue 23, 2004, Pages 3244-3253

Extreme ultraviolet light sources for use in semiconductor lithography - State of the art and future development

Author keywords

[No Author keywords available]

Indexed keywords

DISCHARGE LAMPS; EXCIMER LASERS; IONIZATION; LASER PRODUCED PLASMAS; LIGHT AMPLIFIERS; LITHOGRAPHY; OPTIMIZATION; THERMAL LOAD; ULTRAVIOLET RADIATION;

EID: 10644258117     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/37/23/005     Document Type: Review
Times cited : (132)

References (11)
  • 3
    • 4243437833 scopus 로고
    • Magnetically self-focussing streams
    • Bennett W H 1934 Magnetically self-focussing streams Phys. Rev. 45 890
    • (1934) Phys. Rev. , vol.45 , pp. 890
    • Bennett, W.H.1
  • 5
    • 0141836157 scopus 로고    scopus 로고
    • High power EUV lithography sources based on gas discharges and laser-produced plasmas
    • Stamm U et al 2003 High power EUV lithography sources based on gas discharges and laser-produced plasmas Proc. SPIE 5037 119-29
    • (2003) Proc. SPIE , vol.5037 , pp. 119-129
    • Stamm, U.1
  • 8
    • 3843097074 scopus 로고    scopus 로고
    • High-resolution EUV microstepper tool for resist testing and technology evaluation
    • Brunton A et al 2004 High-resolution EUV microstepper tool for resist testing and technology evaluation Proc. SPIE 5374 869-80
    • (2004) Proc. SPIE , vol.5374 , pp. 869-880
    • Brunton, A.1
  • 11
    • 3843054574 scopus 로고    scopus 로고
    • EUV source power and lifetime: The most critical issues for EUV lithography
    • Stamm U et al 2004 EUV source power and lifetime: the most critical issues for EUV lithography Proc. SPIE 5374 133-44
    • (2004) Proc. SPIE , vol.5374 , pp. 133-144
    • Stamm, U.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.