Study of solid-state reaction of CaCO3 and RuO2 and fabrication of pseudocubic epitaxial thin films by e-beam evaporation

Journal of Alloys and Compounds

Volumn 386, Issue 1-2, 2005, Pages 283-289

  Tian, Hu Yong ^a,b   Chan, Helen Lai Wa ^a   Choy, Chung Loong ^a   Kim, Yang Soo ^b   No, Kwang Soo ^b  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Biaxially textured; CaRuO3; Solid state reaction; Thermal analyses; X ray diffraction

Indexed keywords

AIR; CALCIUM COMPOUNDS; DIFFERENTIAL SCANNING CALORIMETRY; EPITAXIAL GROWTH; EVAPORATION; FABRICATION; OXYGEN; POWDERS; RATE CONSTANTS; RUTHENIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; THERMOGRAVIMETRIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

BIAXIALLY TEXTURED; CARUO3; E-BEAM EVAPORATION; SOLID-STATE REACTIONS;

THIN FILMS;

EID: 10444268148     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2004.05.060     Document Type: Article

References (20)

1. C.B. Eom, R.J. Cava, R.M. Fleming, J.M. Phillips, R.B. van Dover, J.H. Marshall, J.W.P. Hsu, J.J. Krajewski, W.F. Peck Jr., Science 258 (1992) 1766.
2. L. Klein, J.S. Dodge, C.H. Ahn, G.J. Snyder, T.H. Geballe, M.R. Beasley, A. Kapitunik, Phys. Rev. Lett. 77 (1996) 2774.
3. S.C. Gausepohl, M. Lee, R.A. Rao, C.B. Eom, Phys. Rev. B 54 (1996) 8996.
4. J.J. Randall, R. Ward, J. Am, Chem. Soc. 81 (1959) 2629.
5. C.W. Jones, P.D. Battle, P. Lightfoot, W.T.A. Harisson, Acta Crystallogr. Sec. C45 (1989) 365.
6. K. Char, M.S. Colclough, T.H. Geballe, K.E. Myers, Appl. Phys. Lett. 62 (1993) 196.
7. C.B. Eom, R.B. van Dover, J.M. Phillips, D.J. Werder, J.H. Marshall, C.H. Chen, R.J. Cava, R.M. Fleming, Appl. Phys. Lett. 63 (1993) 2570.
8. C.H. Ahn, J.-M. Triscone, L. Antognazza, M. Decroux, R.H. Harnmond, T.H. Geballe, M.R. Beasley, Ø, Fisher, Appl. Phys. Lett. 70 (1997) 206.
9. J.E. Mathis, A. Goyal, D.F. Lee, F.A. List, M. Paranthaman, D.K. Christen, E.D. Specht, D.M. Kroeger, P.M. Martin, Jpn. J. Appl. Phys. 37 (1998) L1379.
10. R.H. Kim, Y.H. Kim, J.W. Park, Mater. Sci. Eng. B 83 (2001) 55.
11. J. Jeske, G. Schmitz, R. Kirchheim, Mater. Sci. Eng. A 270 (1999) 64.
12. S. Chromik, V. Stribik, S. Beoaeka, Mi. Jergel, Ma. Jergel, C. Falcony, E. Andrade, J.C. Cheang-Wong, Superficies y vacio 13 (2001) 57.
13. R.A. Rao, Q. Gan. C.B. Eom, R.J. Cava, Y. Suzuki, J.J. Krajewski, S.C. Gausepohl, M. Lee, Appl. Phys. Lett. 70 (1997) 3035.
14. L. Mie'ville, E. Koller, J.-M. Triscone, M. Decroux, Ø. Fischer, E.J. Williams, Phys. Rev. B 54 (1996) 9525.
15. J.S. Lee, Y.S. Lee, T.W. Noh, K. Char, J. Park, S.-J. Oh, J.-H. Park, C.B. Eom, T. Takeda, R. Kanno, Phys. Rev. B 64 (2001) 245107.
16. R.J. Kennedy, R. Madden, P.A. Stampe, J. Phys. D: Appl. Phys. 34 (2001) 1853.
17. H. Funakubo, T. Oikawa, N. Higashi, K. Saito, J. Cryst. Growth 235 (2002) 401.
18. N. Higashi, T. Watanabe, K. Saito, I. Yamaji, T. Akai, H. Funakubo, J. Cryst. Growth 229 (2001) 450.
19. P. Ahonen, A.S. Gurav, E.I. Kauppinen, M.J. Hampden-Smith, T.T. Kodas, J. Aerosol. Sci. 27 (1996) S373.
20. W.E. Bell, M. Tagami, J. Phys. Chem. 67 (1963) 2432.