Atom probe field ion microscopy investigation of the early interreaction stages in Al/Ni couples

Materials Science and Engineering: A

Volumn 270, Issue 1, 1999, Pages 64-68

  Jeske, T ^a   Schmitz, G ^a   Kirchheim, R ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

Field ion microscopy; In situ specimen treatment; Specimen preparation and handling

Indexed keywords

ALUMINUM; ANNEALING; DEPOSITION; EVAPORATION; INTERMETALLICS; METALLOGRAPHIC MICROSTRUCTURE; NICKEL; PHASE COMPOSITION; VACUUM APPLICATIONS;

ATOM PROBE FIELD ION MICROSCOPY; ELECTRON BEAM EVAPORATION; IN SITU SPECIMEN TREATMENT; MICROSCOPE VACUUM CHAMBER;

MICROSCOPIC EXAMINATION;

EID: 0008726091     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(99)00230-0     Document Type: Article

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