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Volumn 32, Issue 6, 1997, Pages 737-742
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Deposition of Ag0.5Cu0.5InTe2 thin films using a stepwise evaporation method
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Author keywords
A. alloys; A. semiconductors; A. thin films; B. vapor deposition; C. electron microscopy
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
COMPOSITION;
CRYSTAL STRUCTURE;
EVAPORATION;
FILM GROWTH;
STOICHIOMETRY;
TEMPERATURE;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY ANALYSIS;
ENERGY DISPERSIVE ANALYSIS OF X RAYS;
SILVER COPPER INDIUM TELLURIDE;
STEPWISE EVAPORATION METHOD;
STRUCTURAL CHARACTERIZATION;
SEMICONDUCTING SILVER COMPOUNDS;
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EID: 0031163017
PISSN: 00255408
EISSN: None
Source Type: Journal
DOI: 10.1016/S0025-5408(97)00033-0 Document Type: Article |
Times cited : (4)
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References (16)
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