Deposition of Ag0.5Cu0.5InTe2 thin films using a stepwise evaporation method

Materials Research Bulletin

Volumn 32, Issue 6, 1997, Pages 737-742

  Kasiviswanathan, S ^a   Kar, A K ^a   Mathur, B K ^a   Raghavan, K Srinivasa ^b   Rangarajan, G ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

A. alloys; A. semiconductors; A. thin films; B. vapor deposition; C. electron microscopy

Indexed keywords

CHEMICAL VAPOR DEPOSITION; COMPOSITION; CRYSTAL STRUCTURE; EVAPORATION; FILM GROWTH; STOICHIOMETRY; TEMPERATURE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

ENERGY DISPERSIVE ANALYSIS OF X RAYS; SILVER COPPER INDIUM TELLURIDE; STEPWISE EVAPORATION METHOD; STRUCTURAL CHARACTERIZATION;

SEMICONDUCTING SILVER COMPOUNDS;

EID: 0031163017     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(97)00033-0     Document Type: Article

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