Fractal nature of crystalline-crystalline interface in CuInSe2 thin films

Materials Research Bulletin

Volumn 37, Issue 8, 2002, Pages 1475-1480

  Malar, P ^a   Kasiviswananthan, S ^a   Devanathan, Ram ^a   Das, V Damodara ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

A. Semiconductors; A. Thin films; B. Vapor deposition; C. Electron microscopy; D. Microstructure

Indexed keywords

COPPER COMPOUNDS; CRYSTAL MICROSTRUCTURE; CRYSTALLINE MATERIALS; CRYSTALLIZATION; ELECTRON DIFFRACTION; ELECTRON IRRADIATION; FRACTALS; SEMICONDUCTOR MATERIALS; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY; VAPOR DEPOSITION;

ELECTRON MICROGRAPHS;

THIN FILMS;

EID: 0036646428     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(02)00776-6     Document Type: Article

References (11)