Possibility of Charge Contrast Imaging of Polymeric Materials

Scanning

Volumn 25, Issue 5, 2003, Pages 240-242

  Gauvin, Raynald ^a   Robertson, Kevin ^a   Leberre, Jean Francois ^a   Finch, James ^a   Griffin, Brendan J ^b  

^a MCGILL UNIVERSITY   (Canada)

^b UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

Charge contrast imaging; Polymers; Variable pressure scanning electron microscopy

Indexed keywords

IMAGING TECHNIQUES; MICROSTRUCTURE; POLYVINYL CHLORIDES; SCANNING ELECTRON MICROSCOPY;

CHARGE CONTRAST IMAGING (CCI); ENVIRONMENTAL SECONDARY ELECTRON DETECTOR (ESED);

POLYETHYLENES;

POLYETHYLENE; POLYMER; POLYVINYLCHLORIDE;

ANALYTICAL EQUIPMENT; ARTICLE; CHARGE CONTRAST IMAGING; ELECTRON; ENVIRONMENTAL SECONDARY ELECTRON DETECTOR; IMAGING; MATERIALS; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; ULTRASTRUCTURE;

EID: 1042291880     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950250504     Document Type: Article

References (7)

1. Doehne E: Charge contrast: Some ESEM observations of a new/old phenomenon. Microsc Microanal (suppl 2): S292-S293 4, (1998)
2. Griffin BJ: A new mechanism for the imaging of crystals structure in non-conductive materials: An application of charge-induced contrast in the environmental scanning electron microscope (ESEM). Microsc Microanal (suppl 2) S1197-S1198) 3, (1997)
3. Griffin BJ: Charge contrast imaging of material growth and defects in ESEM-linking electron emission and cathodoluminescence. Scanning 22, 234-242 (2000)
4. Mohan A, Khanna N, Hwu J, Joy DC: Secondary electron imaging in the variable pressure scanning electron microscope. Scanning 20, 436-441 (1998)
5. Robertson K, Gauvin R, Finch J: Charge contrast imaging of gibb-site using the variable pressure scanning electron microscope. Microsc Microanal (in press) (2003)
6. Toth M, Phillips MR, Thiel BL, Donald AM: Electron imaging of dielectrics under simultaneous electron-ion irradiation. J Appl Phys 91, 7, 4479-4491 (2002)
7. Watt GR, Griffin BJ, Kinny PD: Charge contrast imaging of geological materials in the environmental scanning electron microscope. Amer Mineralog 85, 11-12, 1784-1794 (2000)