CHARGE CONTRAST: SOME ESEM OBSERVATIONS OF A NEW/OLD PHENOMENON

Microscopy and Microanalysis

Volumn 4, Issue , 1998, Pages 292-293

  Doehne, Eric ^a  

^a GETTY CONSERVATION INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22444455688     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600021589     Document Type: Article

References (5)

1. Griffin, B. J.: A new mechanism for the imaging of crystal structure in non-conductive materials: An application of charge-induced contrast in the environmental scanning electron microscope (ESEM). Microscopy and Microanalysis, 1197-1198 (1997).
2. Harker, A. B., D. G. Howitt, J. F. DeNatale, and J. F. Flintoff: Charge-sensitive secondary electron imaging of diamond microstructures. Scanning, 16, 87-90 (1994).
3. Harker, A. B., J. F. DeNatale, J. F. Flintoff, and J. J. Breen: Direct observation of the defect structure of polycrystalline diamond by scanning electron microscopy. Applied Physics Letters, 62, 105-7 (1993).
4. 2 surface. Scanning, 19, 416-425. (1997)
5. Sawyer, G. R. and T.F. Page: Microstructural characterization of 'REFEL' reaction bonded silicon carbide. Journal of Materials Science. 13, 885-904 (1978)