New thermochromic bilayers for optical or electronic switching systems

Thin Solid Films

Volumn 449, Issue 1-2, 2004, Pages 166-172

  Saitzek, Sébastien ^a   Guirleo, Guillaume ^a   Guinneton, Frédéric ^a   Sauques, Laurent ^b   Villain, Sylvie ^a   Aguir, Khalifa ^c   Leroux, Christine ^a   Gavarri, Jean Raymond ^a  

^a UNIVERSITÉ DE TOULON   (France)

^b LOT/OPL   (France)

^c AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

Cerium; Multilayers; Optical properties; Vanadium oxide

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERIUM COMPOUNDS; ELECTRIC CONDUCTIVITY OF SOLIDS; ELLIPSOMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT ABSORPTION; MULTILAYERS; OPTICAL SWITCHES; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; SWITCHING SYSTEMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

REACTIVE SPUTTERING; VANADIUM OXIDE;

THIN FILMS;

EID: 1042269661     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.10.013     Document Type: Article

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