SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 413, Issue 1-2, 2002, Pages 198-202

Refractive index profiling of CeO2 thin films using reverse engineering methods

(2) Janicki, V a Zorc, H a

a RUDER BO KOVI INSTITUTE (Croatia)

Author keywords

Depth profiling; Optical coatings; Optical properties; Oxides

Indexed keywords

CERIUM COMPOUNDS; COMPUTER SIMULATION; ELLIPSOMETRY; EVAPORATION; FILM PREPARATION; LIGHT TRANSMISSION; MONOLAYERS; MULTILAYERS; OPTICAL COATINGS; OPTICAL FILMS; REFRACTIVE INDEX; REVERSE ENGINEERING; SPECTROSCOPIC ANALYSIS;

INHOMOGENEOUS FILMS;

THIN FILMS;

EID: 0037166577 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(02)00336-X Document Type: Article

Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.