Minimizing errors in electron microprobe analysis

Microscopy and Microanalysis

Volumn 7, Issue 2, 2001, Pages 168-177

  Lifshin, Eric ^a   Gauvin, Raynald ^b  

^a STATE UNIVERSITY OF NEW YORK   (United States)

^b UNIVERSITÉ DE SHERBROOKE   (Canada)

Author keywords

Accuracy; Crystal diffraction spectrometry; Energy dispersive X ray spectrometry; Monte Carlo calculations; Precision; Quantitative analysis; X ray counting statistics

Indexed keywords

EID: 0041028752     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

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