Synthesis and structural, electrochromic characterization of pulsed laser deposited vanadium oxide thin films

Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films

Volumn 19, Issue 3, 2001, Pages 887-892

  Fang, Guo Jia ^a,b   Liu, Z L ^a   Wang, Yu ^a   Liu, Y H ^a   Yao, K L ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b HUBEI UNIVERSITY OF ARTS AND SCIENCE   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL ORIENTATION; ELECTROCHROMIC DEVICES; FILM GROWTH; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GLASS; NANOSTRUCTURED MATERIALS; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; RAMAN SCATTERING; SECONDARY BATTERIES; SILICON WAFERS; STOICHIOMETRY; TRANSMISSION ELECTRON MICROSCOPY; VANADIUM; X RAY DIFFRACTION;

CYCLIC VOLTAMMOGRAMS; VANADIUM OXIDE THIN FILMS;

THIN FILMS;

EID: 0035334335     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1359533     Document Type: Article

References (20)