Blisters in as-deposited films of b.c.c. stainless steel

Surface and Coatings Technology

Volumn 80, Issue 3, 1996, Pages 251-254

  Eymery, J P ^a   Denanot, M F ^a  

^a UNIVERSITÉ DE POITIERS   (France)

Author keywords

Blisters; Residual stress; Scanning electron microscopy; Stainless steel; Thin films

Indexed keywords

BUCKLING; DELAMINATION; ESTIMATION; ION BEAMS; MATHEMATICAL MODELS; MORPHOLOGY; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; SPUTTER DEPOSITION; STAINLESS STEEL; STRESS ANALYSIS;

BLISTERS; ION BEAM SPUTTERING; RESIDUAL COMPRESSIVE STRESS; STRESS STATE;

THIN FILMS;

EID: 0030128153     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/0257-8972(95)02466-2     Document Type: Article

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