Epitaxial growth and ferroelectric properties of SrBi2Nb 2O9(115) thin films grown by pulsed-laser deposition on epitaxial Pt(111) electrode

Applied Physics Letters

Volumn 83, Issue 26, 2003, Pages 5500-5502

  Duclere J R ^a   Guilloux Viry, M ^a   Bouquet, V ^a   Perrin, A ^a   Cattan, E ^b   Soyer, C ^b   Remiens D ^b  

^a Laboratoire de Chimie du Solide et Inorganique Moleculaire de Rennes   (France)

^b UNIVERSITÉ DE VALENCIENNES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMICAL ELECTRODES; EPITAXIAL GROWTH; FATIGUE TESTING; FERROELECTRICITY; LIGHT POLARIZATION; MOLECULAR DYNAMICS; MORPHOLOGY; PERMITTIVITY; PULSED LASER DEPOSITION; REMANENCE; SPUTTERING; STRONTIUM COMPOUNDS; THERMAL EFFECTS; X RAY DIFFRACTION;

NONVOLATILE RANDOM ACCESS MEMORIES (NVRAM); REMANENT POLARIZATION;

THIN FILMS;

EID: 0942299465     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1634387     Document Type: Article

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