Metal/semiconductor superlattices containing semimetallic ErSb nanoparticles in GaSb

Applied Physics Letters

Volumn 84, Issue 2, 2004, Pages 221-223

  Hanson, M P ^a   Driscoll, D C ^a   Kadow, C ^a   Gossard, A C ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; ERBIUM ALLOYS; FERMI LEVEL; HALL EFFECT; MOLECULAR BEAM EPITAXY; NANOSTRUCTURED MATERIALS; NUCLEATION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING GALLIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

EPITAXIAL SUPERLATTICE; HOLE CONCENTRATION;

SEMICONDUCTOR SUPERLATTICES;

EID: 0842311706     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1639932     Document Type: Article

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