High performance single emitter homojunction interfacial work function far infrared detectors

Journal of Applied Physics

Volumn 95, Issue 2, 2004, Pages 512-519

  Esaev, D G ^a   Rinzan, M B M ^a   Matsik, S G ^a   Perera, A G U ^a   Liu, H C ^b   Zvonkov, B N ^c   Gavrilenko, V I ^c   Belyanin, A A ^d  

^a GEORGIA STATE UNIVERSITY   (United States)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^c INSTITUTE FOR PHYSICS OF MICROSTRUCTURES   (Russian Federation)

^d TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACIAL WORK FUNCTION; TRANSMISSION SPECTRA;

ABSORPTION SPECTROSCOPY; BOUNDARY CONDITIONS; DOPING (ADDITIVES); ELECTRIC FIELD EFFECTS; ETCHING; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PERMITTIVITY; PHONONS; PHOTOEMISSION; PROBABILITY; QUANTUM EFFICIENCY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING GALLIUM;

INFRARED DETECTORS;

EID: 0742320706     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1632553     Document Type: Article

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