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Volumn 18, Issue 12, 2003, Pages 2859-2868

Heteroepitaxial growth of tungsten oxide films on silicon(100) using a BaF2 buffer layer

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BARIUM COMPOUNDS; CYCLOTRON RADIATION; DEPOSITION; ELECTROCHROMIC DEVICES; ELECTRONIC EQUIPMENT; EVAPORATION; FILM GROWTH; MICROSTRUCTURE; SEMICONDUCTOR MATERIALS; SENSORS; SILICON; THERMODYNAMICS; TUNGSTEN COMPOUNDS; WEAR OF MATERIALS;

EID: 0742268859     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2003.0399     Document Type: Article
Times cited : (12)

References (34)
  • 18
    • 0040170627 scopus 로고
    • Gas-Phase and Surface Chemistry in Electronic Materials Processing, edited by T.J. Mantziaris, G.R. Paz-Pujalt, F.T.J. Smith, and P.R. Westmoreland, Pittsburgh, PA
    • T.K. Chu, F. Santiago, M. Stumborg, and C.A. Huber, in Gas-Phase and Surface Chemistry in Electronic Materials Processing, edited by T.J. Mantziaris, G.R. Paz-Pujalt, F.T.J. Smith, and P.R. Westmoreland (Mat. Res. Soc. Symp. Proc. 334, Pittsburgh, PA, 1994), pp. 501-506.
    • (1994) Mat. Res. Soc. Symp. Proc. , vol.334 , pp. 501-506
    • Chu, T.K.1    Santiago, F.2    Stumborg, M.3    Huber, C.A.4
  • 19
    • 0003397937 scopus 로고    scopus 로고
    • edited by W.K. Liu and M.B. Santos (World Scientific, Singapore)
    • M.A. Olmstead, Thin Films: Heteroepitaxial Systems, edited by W.K. Liu and M.B. Santos (World Scientific, Singapore, 1999), Vol. 15.
    • (1999) Thin Films: Heteroepitaxial Systems , vol.15
    • Olmstead, M.A.1
  • 24
    • 85039587164 scopus 로고    scopus 로고
    • JCPDS 04-0452, 43-1035, 46-0646, Diffraction Tables, International Center for Diffraction Data, Newton Square, PA, 1997
    • JCPDS 04-0452, 43-1035, 46-0646, Diffraction Tables, International Center for Diffraction Data, Newton Square, PA, 1997.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.