In situ four-point conductivity and Hall effect apparatus for vacuum and controlled atmosphere measurements of thin film materials

Review of Scientific Instruments

Volumn 73, Issue 6, 2002, Pages 2325-

  Moulzolf, S C ^a   Frankel, D J ^a   Lad, R J ^a  

^a UNIVERSITY OF MAINE   (United States)

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EID: 0036608476     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1475349     Document Type: Article

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