Masking of Unknown Output Values during Output Response Compression by Using Comparison Units

IEEE Transactions on Computers

Volumn 53, Issue 1, 2004, Pages 83-89

  Pomeranz, Irith ^a   Kundu, Sandip ^b   Reddy, Sudhakar M ^c  

^a PURDUE UNIVERSITY   (United States)

^b INTEL CORPORATION   (United States)

^c UNIVERSITY OF IOWA   (United States)

Author keywords

Built in self test; Output response compression; Scan design

Indexed keywords

OUTPUT RESPONSE COMPRESSION; SCAN DESIGN;

COMPUTER SIMULATION; ELECTRONIC DOCUMENT IDENTIFICATION SYSTEMS; FAULT TOLERANT COMPUTER SYSTEMS; FORMAL LOGIC; SEQUENTIAL CIRCUITS; SYSTEMS ANALYSIS;

BUILT-IN SELF TEST;

EID: 0742268823     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/TC.2004.1255794     Document Type: Article

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